EDISION

Jeol STEM Transmission electron microscope JEM-3100F 300kV

Description: Jeol STEM Transmission electron microscope JEM-3100F 300kV This is a used JEM 3100F STEM electron microscope system that was installed in 2007 and was used in a lab until 2017 when it was professionally dismantled by Jeol and put into 16 separate crates. There are many accessories included along with a 2 foot high stack of manuals and all of the service records for the system since it was initially installed. This JEM-3100F Field Emission STEM Electron Microscope is used for microscopic observation at the atomic or molecular level. Four illumination modes are possible, which are TEM, NBD, EDS and CBD. The electron gun is a ZrO/W(100) emitter with up to 300kV accelerating voltage. The main microscope column is in the center of the system with the right and left consoles to the sides and the high voltage generator in the back. The electron gun is bolted to the top of the microscope column and also connects to the high voltage generator in the rear. The scope is cooled with a Haskris water chiller. The main microscope is made by JEOL but there are many ancillary components made by other manufacturers such as Gatan, Oxford and Haskris. The Gatan electron energy filter provides aberration correction with a multi-port, high-speed, high-resolution CCD sensor to capture highly detailed EELS and EFTEM data sets. Other Gatan products included are the instrumentation bin, the Digiscan II and the STEM controller. The Oxford products include the TEM 250 energy dispersive spectroscopy system. There are two PCs, each with many software programs from Gatan, Jeol and Oxford. Once installed, this system requires utilities such as nitrogen, liquid nitrogen, SF6 gas, cooling water and of course 230V three phase power. Most of the components are still packaged in the original crates as shipped from the original government contractor. The items appear unpacked were previously packed and removed from their packaging for inspection and photos. The main column is the heaviest crate at about 5000lbs and the total of all 16 crates is close to 18000 lbs. They would all fit in a 40 foot container.300kV max accelerating voltage with semi-continuous HV control, 100 eV/step minimum. Electrode short mechanism for operation at 200 kV and 100kvResolution: Point image: UHR = 0.17nM, HR = 0.19 nM, HC = 0.26 nMLattice image: UHR = .1 nM, HR = 0.1 nM, HC = 0.14 nMEM-30145 Field emission gun (FEG)Emitter temp: 1600-1800 deg KProbe current: .65na/1nm (at FWHM)emission method: Zro/W(100)Equipped with electron energy loss spectroscopy (EELS) and EDXSDifferential vacuum system utilizing sputter ion and diffusion pumpsEucentric motorized 5 axis side entry GoniometerUltra high resolution pole piece.17 nm point to point resolution.13 steradian solid angle with 30 mm2 detector.18 steradian solid angle with 50mm2 detectorPiezo stage: .04nm stepHigh contrast objective aperture: EM-40080Selectable apertures: open, 20,50,70,150 uMUHR, HR , HC configurationsTEM, EDS, NBD, CBD modesUtilities:Nitrogen gasLiquid nitrogenSF6 gascooling water: 10 l/minJUS-MSI multi-scan interface unit (allows microscope to have two or more independent external control sources)Sheet film system160mm viewing windowGatan GIF 863 Tridiem – Electron energy filterCombines 3rd order spectrometer aberration correction with multi-port, high-speed, high-resolution CCD sensor to capture highly detailed EELS and EFTEM data sets.120mRad full azimuth2k x 2k Ultrascan 1000 FT camera with 4 port.Oxford Inca Energy TEM250energy dispersive x-ray spectrometer, pulse processor, and EDXS analysis systemInca Xstream D6989Inca MICSGatan Instrumentation binGatan Digiscan II – SEM/STEM image acquisition system, digitizes STEM scan ramps and sends to computer via PC daughter boardOrius CCD camera controllerGatan Gate valve controller 678-35000Gatan 806 stem detector controllerHaskris ChillerUPS unitHT control and resistorOrius Camera 830J49U23Tilt angle controllerBiprism power supply and column drive EMZ09441TBP31FPiezo power supply EM-31000FBUElectrode short switch EM-30180ComputersDell 7500 2011Win 7, 12 GB ram Xeon 2.6 ghzGatan Digital Micrograph ver 2.31.734.0Jeol 3100 External ServerGray HP compaqOxford Microanalysis suite 17 +, Inca version 4.07, suite key rev 3, energy TEM250Gatan digital micrographSoftwareGatan Microscopy Suite (from packing list)700.P2000.1 Digital MicrographDigiscan (688,788)GIF Tridiem (863)777.U4P STEMpack upgrade to 4 pulseModel 806 HAADF STEM702.60P Tecnaui Integration703.30P/703.31P/707.10 EDS Acquistion703.40P SI STEM EELS730.00 TEM Tomography730.15 EFTEM Tomography730.25 STEM Tomography707.20 EDS analysisOxford Inca Aztec ISSUE 2.2 from 201 Specifications:MFG: JeolModel: JEM-3100FSerial: EM12600001Volts: 208Amps: 9kva Phase: 3Year: 2006Manuals: many bindersWeight: 18000 LbsCondition: usedAll dims inches unless otherwise notedInventory #: 9430    WE SHIP INTERNATIONALLY contrary to the Ebay statement that says we only ship to united states.  Contact us for shipping quotes  International purchases: A $40 documentation processing fee will be added to total purchase for items under $150. Our company return policy is that our description is guaranteed and we will accept returns in the event an item is mis-described. When communicating with us please use your own email address.  We want to know who we are communicating with and we cannot identify specific emails in our inbox using the ebay email system.   Send emails to heritageequipment AT gmail . com            The new ebay buyer protection program has inspired us to offer all of our items “as-is”.This does not mean that you are buying a machine with deficiencies, known or unknown.  What it means is that some of our items will be tested and will include the results in the description and others will be untested but described accurately to the extent that is possible without actually powering up the machine.  In addition to this written description you will have the opportunity to view high quality photos of the item.  With these two sources of information you will have as much information as possible without being physically here to inspect the machine.  Feel assured that we will make a diligent effort to give you an accurate description of the equipment. As a buyer you should be aware that you are buying an expensive piece of equipment at a greatly reduced price and as such you may have to deal with certain unknowns and defective components which were not known and could not be known without full scale setup and operation of the machine.  Our experience in dealing with many specialized pieces of equipment has proven this to be a rare occurrence however it is a risk inherent in buying used equipment.  The very few times we have had to deal with these issues we have been very helpful in resolving the problem.

Price: 225000 USD

Location: Morgantown, Pennsylvania

End Time: 2024-08-19T14:20:40.000Z

Shipping Cost: N/A USD

Product Images

Jeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kVJeol STEM Transmission electron microscope JEM-3100F 300kV

Item Specifics

All returns accepted: ReturnsNotAccepted

Recommended

Jeol Gun Lift Control Box GC1 Electron Gun STEM TEM SEM EMI20023 TA
Jeol Gun Lift Control Box GC1 Electron Gun STEM TEM SEM EMI20023 TA

$159.99

View Details
Jeol STEM Transmission electron microscope JEM-3100F 300kV
Jeol STEM Transmission electron microscope JEM-3100F 300kV

$225000.00

View Details